Thin-Film Resistor Array Characterization

摘要

This paper provides the results of thin-film resistor array testing which wasrecently performed at the System Simulation and Development Directorate (SSDD), Research, Development, and Engineering Center (RDEC). The objective of these tests was to determine the suitability of the Australian thin-film resistor technology for use as a key component in an Infrared Scene Projector (IRSP) for Hardware-in-the-Loop (HWIL) simulations involving systems which utilize linear rows of detectors. The tests were configured to measure spatial uniformity, temporal response, dynamic range, and relative energy output as a function of power input. D65O funding was used to purchase the resistor arrays. (MM).