Analytical Electron Microscopy of Nanometer-Sized Particles

摘要

During the past quarter, despite lengthy downtime for the JEOL 4000FX, twoaspects of our research plan were initiated: microdiffraction and the effects of prolonged beam exposure on the EELS signature of U oxides. While obtaining microdiffraction patterns, it was recognized that high resolution electron microscope images can be obtained on thin sections produced by ultramicrotomy.