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Near Field Optical Microscopy Using a Vibrating Knife Edge or Stylus

机译:使用振动刀刃或触针的近场光学显微镜

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The problem studied was the detection of sub-wavelength detail by scanning near-field microscopy, using a vibrating knife-edge/stylus rather than an aperture probe. A related problem was phase detection of an optical field by such scanning, not necessarily in the sub-wavelength region. MOST IMPORTANT RESULTS: (1) Demonstration of one-dimensional principle of operation; (2) Demonstration of non sub-wavelength two-dimensional microscope with vibrating knife edge corner; (3) Demonstration of non sub-wave length two-dimensional tomographic microscope with vibrating knife edge; (4) Analysis and simulation of evanescent wave to plane wave conversion; (5) Analysis and demonstration of phase measuring properties of one-dimensional vibrating knife edge microscope. (AN).

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