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Postfabrication Native-Oxide Improvement of the Reliability of Visible-SpectrumAlGaAs-In(AlGa)P p-n Heterostructure Diodes

机译:后加工原生氧化物改善可见光谱alGaas-In(alGa)p p-n异质结构二极管的可靠性

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摘要

Data are presented on the electrical behavior and the reliability ofpostfabrication native-oxide-passivated visible-spectrum AlGaAs-In (AlGa)P p-n heterostructure light emitting diodes (LEDs). The LEDs are oxidized (H2O + 2N, 500 deg, 1 h) after metallization, thus sealing all exposed AlGaAs crystal at cracks. fissures, and edges against atmospheric hydrolysis without degrading

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