Magnetic Microscope for the Inspection of Multichip Modules

摘要

We have established that it is feasible to design and construct a hightemperature superconductor (HTS) superconducting quantum interference device (SQUID) microscope for the inspection of multichip modules (MCM). An innovative HTS SQUID microscope which incorporates a room temperature scanning sample stage was designed, constructed, and is generating images from a variety of samples.