A different type of reentrant behavior in superconductor/thin graphite film/superconductor Josephson junctions

摘要

We experimentally studied current-voltage characteristics of superconductor/thin graphite film/superconductor Josephson junctions. A reentrant behavior in the differential conductance was observed at low bias voltages just above the structure due to supercurrent. The gate voltage dependence of the conductance peak shows that the origin of the reentrant behavior is different from that for the conventional reentrant behavior seen in a disordered normal metal coupled to a superconductor.