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首页> 外文期刊>Physica, C. Superconductivity and its applications >Effect of post-annealing on critical current density of (Bi,Pb)-2223/Ag tapes
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Effect of post-annealing on critical current density of (Bi,Pb)-2223/Ag tapes

机译:后退火对(Bi,Pb)-2223 / Ag带临界电流密度的影响

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摘要

The effect of post-annealing on critical current density of (Bi,Pb)-2223/Ag tapes has been investigated. The fully reacted (Bi,Pb)-2223/Ag multifilament tapes were post-annealed in different processing parameters, including postannealing temperature, dwelling time and oxygen partial pressure. Experimental results show that post-annealing at low temperature in reduced oxygen partial pressure can improve the critical current density. With decreasing oxygen partial pressure. the optimal temperature range of post-annealing shifts to lower temperature. The effect of post-annealing could be related to the increase of (Bi,Pb)-2223 phase and the formation of Pb3Sr2.5Bi0.5Ca2CuOy (3321 phase) as well as the improvement of gain connectivity. (C) 2004 Elsevier B.V. All rights reserved.
机译:研究了后退火对(Bi,Pb)-2223 / Ag胶带的临界电流密度的影响。完全反应的(Bi,Pb)-2223 / Ag复丝带在不同的加工参数(包括退火后温度,停留时间和氧分压)下进行后退火。实验结果表明,在较低的氧气分压下进行低温后退火可以提高临界电流密度。随着氧气分压的降低。后退火的最佳温度范围转移到较低温度。后退火的效果可能与(Bi,Pb)-2223相的增加和Pb3Sr2.5Bi0.5Ca2CuOy(3321相)的形成以及增益连接性的提高有关。 (C)2004 Elsevier B.V.保留所有权利。

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