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首页> 外文期刊>Physica status solidi, B. Basic research >Electrical properties of polycrystalline TiO2 at elevated temperatures. Electrical conductivity
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Electrical properties of polycrystalline TiO2 at elevated temperatures. Electrical conductivity

机译:高温下多晶TiO2的电性能。电导率

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IN MEMORIAM. This paper is dedicated to the memory of Dr. J. Bruce Wagner, Jr. (1926-2006), long time Professor of Materials Science and Engineering at the Northwestern University, Evanston, IL and Regents Professor of the Arizona State University, Tempe, AZ. Professor Wagner was prominent scientist in the area of solid-state science, electrochemistry and high temperature chemistry. He served as Director of the Material Research Centre at the Technological Institute of Northwestern University, Director of the Centre for Solid State Science at the Arizona State University. He was also the President of the Electrochemical Society. The present work reports the electrical properties for high purity polycrystalline TiO2 using the measurements of electrical conductivity in the temperature range 1123-1323 K and in the gas phase of controlled oxygen activity (10(-13) Pa < p(O-2) < 10(5) Pa). The slope of the log sigma vs log p(O-2) dependence is -1/5.4, which is considered in terms of mixed electronic and ionic compensation. The electrical conductivity data within the n-p transition were used for the determination of the conductivity components related to electrons, electron holes and ions. These data were used for the determination of the n-p transition point. The band gap determined from the conductivity components related to electronic charge carriers is equal to 2.8 eV. (c) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
机译:在悼念。本文致力于纪念J. Bruce Wagner,Jr.博士(1926-2006),西北大学材料科学与工程学教授,伊利诺伊州伊万斯顿和摄政大学亚利桑那州立大学Regents教授, AZ。瓦格纳教授是固态科学,电化学和高温化学领域的杰出科学家。他曾任西北大学技术学院材料研究中心主任,亚利桑那州立大学固体科学中心主任。他还是电化学学会的会长。本工作报告了在1123-1323 K温度范围内以及在受控氧活度(10(-13)Pa (O-2)< 10(5)Pa)。 log sigma与log p(O-2)的依存关系的斜率为-1 / 5.4,这是根据混合的电子和离子补偿考虑的。 n-p跃迁内的电导率数据用于确定与电子,电子空穴和离子有关的电导率成分。这些数据用于确定n-p转变点。由与电子载流子有关的电导率分量确定的带隙等于2.8 eV。 (c)2007年WILEY-VCH Verlag GmbH&Co. KGaA,韦恩海姆。

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