Spin dependence scattering and spin-flip effect on the current-in-plane transport behavior in NiO-based-spin valve

摘要

Camley and Barnas (CB) model was improved by taking into consideration of the interface scattering and bulk spin-flip effect. The comparison between model's prediction and experimental data shows that the spin-flip effect plays an indispensable role in affecting the MR of spin valves. The electron spin specular reflectivity at the interface of NiO/Co in NiO-containing Co/Cu/Co spin valves is determined using the improved CB model, which varies with the structural configuration and the annealing temperature. Combination of the calculated data and the experimental results indicates that smooth interface of NiO/Co may mean large spin specular reflectivity.