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Weak-beam transmission electron microscopy study of dislocation accommodation processes in nickel Sigma=3 grain boundaries

机译:镍Sigma = 3晶界中位错适应过程的弱束透射电子显微镜研究

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The first steps of the accommodation of extrinsic dislocations in Sigma = 3 grain boundaries have been observed in nickel bicrystals. Two types of reaction have been investigated in detail using the weak-beam technique in addition to conventional transmission electron microscopy analyses and the image-matching technique. In one case, the decomposition of a trapped lattice dislocation in two products, not visible in the bright-field condition, can be seen as the necessary step preceding the emission of one product dislocation into the neighbouring crystal. This means that dislocation transmission through a grain boundary, even Sigma = beta, is never a direct process. In the other case, a reaction between an extrinsic dislocation and an intrinsic dislocation having different line orientations could be analysed owing to the visualization of a small dislocation segment in the weak-beam condition. This reaction has been interpreted as the first step of incorporation of an extrinsic dislocation in the intrinsic network. [References: 31]
机译:在镍双晶中已观察到在Sigma = 3晶界中适应外在位错的第一步。除了常规的透射电子显微镜分析和图像匹配技术之外,还使用弱束技术对两种类型的反应进行了详细研究。在一种情况下,两种产物中陷获的晶格位错的分解在明场条件下不可见,可以看作是将一种产物位错发射到相邻晶体之前的必要步骤。这意味着通过晶界(甚至Sigma = beta)的位错传输绝不是直接过程。在另一种情况下,由于弱束条件下小位错段的可视化,可以分析外部位错与具有不同线取向的本征位错之间的反应。该反应已被解释为在本征网络中引入外在位错的第一步。 [参考:31]

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