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首页> 外文期刊>Photomedicine and laser surgery >Effects of diode laser irradiation on smear layer removal from root canal walls and apical leakage after obturation.
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Effects of diode laser irradiation on smear layer removal from root canal walls and apical leakage after obturation.

机译:二极管激光辐照对阻塞后根管壁涂片层清除和根尖漏出的影响。

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OBJECTIVE: The objective of this study was to investigate the rise in temperature in root surfaces during and immediately after diode laser irradiation, to observe morphological changes of root canal wall after irradiation, and to evaluate the apical leakage after irradiation and obturation in vitro. BACKGROUND DATA: There have been very few reports on root canal treatment by 980-nm wavelength diode laser. METHODS: Sixty-six extracted human single-rooted teeth were instrumented up to size 60 K-file, and then randomly divided into three groups of 22 teeth each. Groups 1 and 2 were irradiated with a diode laser at 5 W for 7 sec using fibers of diameters 550 and 365 microm, respectively. Group 3 was not irradiated, and served as a control. The rise in temperature on root surfaces of the teeth in groups 1 and 2 were measured by thermography. Six teeth in each group were bisected longitudinally and observed morphologically. Other teeth were obturated and immersed in rhodamine B solution, and the degree of apical leakage was evaluated longitudinally and transversally. RESULTS: A maximum temperature rise of 8.1( degrees )C was recorded in group 1. The smear layer in the laser-treated groups was evaporated and removed, resulting in clean root canal walls, which was significantly superior to the control group (p < 0.05). After obturation, the laser-treated groups showed significantly less apical leakage than the control group (p < 0.05). CONCLUSIONS: These results indicate that the diode laser is useful for removing smear layer and debris from root canal walls, and reducing apical leakage after obturation in vitro, and suggest that it would be useful for root canal treatment in clinic.
机译:目的:研究二极管激光辐照过程中和刚照射后根表面温度的升高,观察辐照后根管壁的形态变化,并评估辐照和阻塞后的根尖漏出情况。背景数据:关于用980 nm波长二极管激光器治疗根管的报道很少。方法:对66颗拔出的人单根牙齿进行测量,大小不超过60 K,然后随机分为三组,每组22颗。使用直径分别为550和365微米的光纤,以5W的二极管激光器将第1组和第2组照射7秒。第3组未照射,并作为对照。第1组和第2组牙齿根部表面的温度升高是通过热像仪测量的。每组六个牙齿被纵向平分并在形态上进行观察。将其他牙齿封闭并浸入若丹明B溶液中,纵向和横向评估根尖漏出的程度。结果:第1组的最高温度升高为8.1(℃)。激光治疗组的涂片层被蒸发并去除,从而形成了根管壁干净的组织,其显着优于对照组(p < 0.05)。闭塞后,激光治疗组的根尖漏出明显少于对照组(p <0.05)。结论:这些结果表明,二极管激光器可用于去除根管壁上的污迹层和碎屑,并减少体外阻塞后的根尖漏出,并建议将其用于临床中的根管治疗。

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