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Nanoscale inclusions in the phonon glass thermoelectric material Zn_4Sb_3

机译:声子玻璃热电材料Zn_4Sb_3中的纳米夹杂物

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We have investigated the thermoelectric material Zn_4Sb_3 using transmission electron microscopy (TEM). Nanoscale inclusions with a diameter of about 10nm were observed, constituting on the order of 1 percent by volume of the material. Studies using energy filtered imaging, electron diffraction, and high-angle annular dark-field STEM indicate that the inclusions consist of Zn. These inclusions are expected to scatter the medium and long-wavelength phonons effectively, thus contributing to phonon glass behavior which results in the exceptionally low thermal conductivity for this thermoelectric material.
机译:我们已经使用透射电子显微镜(TEM)研究了热电材料Zn_4Sb_3。观察到直径约10nm的纳米级夹杂物,占材料体积的1%左右。使用能量过滤成像,电子衍射和高角度环形暗场STEM进行的研究表明,夹杂物由Zn组成。这些夹杂物有望有效地散射中波和长波声子,从而有助于声子玻璃的行为,从而导致这种热电材料的导热系数极低。

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