The arrangement of rare-earth atoms at {100} prism planes of La- and Lu-containing polycrystalline Si_3N_4 specimens is studied using high-angle annular dark-field scanning transmission electron microscopy. For both systems, the attachment sites of rare-earth atoms are well-defined and largely conform to the periodicity of the terminating plane of the Si_3N_4 grain. We observe significant differences between the structural arrangement of La and Lu atoms at the interface.
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