首页> 外文期刊>Surface review and letters >INFLUENCE OF THE SUBSTRATE ON THE CRYSTALLINE PHASE AND MORPHOLOGY OF POLY (VINYLIDENE FLUORIDE) (PVDF) THIN FILM
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INFLUENCE OF THE SUBSTRATE ON THE CRYSTALLINE PHASE AND MORPHOLOGY OF POLY (VINYLIDENE FLUORIDE) (PVDF) THIN FILM

机译:基质对聚偏氟乙烯(PVDF)薄膜的结晶相和形貌的影响

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摘要

The effect of substrate on the crystalline phase and morphology of the poly (vinylidene fluoride) (PVDF) thin film has been investigated. The solution of PVDF/Hexamethyl phosphoramide (HMPA) was deposited on four different substrates, namely, silicon ( Si), glass ( SiO2), indium tin oxide (ITO) coated glass and silver (Ag) coated glass respectively by using the spin coating technique. The crystalline structure was investigated using X-ray diffraction (XRD) and Fourier transform infrared (FTIR) techniques. The morphology was determined using scanning electron microscopy (SEM). XRD demonstrated that the structure of PVDF thin films on each substrate is beta-phase with different orientations of the molecular chains. FTIR results conformed XRD that the samples contain beta-phase. SEM shows spherulites structure, which is rough and porous, besides, the size of spherulites and the porosity are different for each sample. The size of spherulites is in average diameter range (1-6 mu m) and this range is attributed to the beta-phase. The nucleation process of beta-phase on the various substrates attributed either to the match of polymer-substrate or to the electrostatic interaction. Among the substrates used, the ITO substrate exhibited a greater tendency for beta-phase formation.
机译:研究了基材对聚偏二氟乙烯(PVDF)薄膜的结晶相和形态的影响。通过旋涂分别将PVDF /六甲基磷酰胺(HMPA)溶液沉积在四个不同的基板上,分别是硅(Si),玻璃(SiO2),氧化铟锡(ITO)涂层玻璃和银(Ag)涂层玻璃技术。使用X射线衍射(XRD)和傅立叶变换红外(FTIR)技术研究了晶体结构。使用扫描电子显微镜(SEM)确定形态。 XRD表明,在每个基底上的PVDF薄膜的结构是β相,其分子链的取向不同。 FTIR结果符合XRD,样品中含有β相。 SEM显示球晶结构粗糙且多孔,此外,每个样品的球晶尺寸和孔隙率均不同。球晶的尺寸在平均直径范围内(1-6μm),并且该范围归因于β相。 β相在各种基质上的成核过程归因于聚合物基质的匹配或静电相互作用。在所使用的衬底中,ITO衬底表现出更大的β相形成趋势。

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