Structural and Electrical Properties of Resistive Thermal Evaporated Cd_(1-x)Mn_xS Nano-Crystalline Films

摘要

Thin films of Cd_(1-x)Mn_xS (0 < = x < = 0.5) were prepared on window glass substrates by resistive vacuum thermal evaporation. All the films were deposited at 300 K and the films annealed at 373 K, 473 K and 573 K for 1 hour in a vacuum of 10~(-6) m centre dot bar. The as-deposited and the annealed films were characterized by ED AX, XRD, AFM, electrical conductivity and Hall Effect studies.