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A high-Tc SQUID micro-detector with a high performance magnetic shield for contaminant detection in industrial products

机译:具有高性能磁屏蔽的高Tc SQUID微型检测器,用于工业产品中的污染物检测

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摘要

A high-T-c superconducting quantum interference device (SQUID) system for the detection of magnetic foreign matter in industrial products was developed. There is a possibility that ultra-small metallic foreign matter has been accidentally mixed with industrial products such as lithium ion batteries. Metallic particles with outer dimensions less than 100 mu m cannot be detected by conventional x-ray imaging. Therefore we developed a detection system based on a high-T-c SQUID microscope with a high performance magnetic shield. The use of SQUID microscopes with a 0.5 mm thick vacuum window was proposed. This design enables the SQUID to approach the object to be measured as close as 1 mm and enhances the sensitivity. A new magnetic shield with sleeves was carefully designed and built. As a result, we could successfully measure small particles sized 100 mu m. This detection level was hard to achieve using a conventional x-ray detection method.
机译:开发了一种用于检测工业产品中磁性杂质的高T-c超导量子干涉仪(SQUID)系统。超细金属异物可能会意外混入锂离子电池等工业产品。常规的X射线成像无法检测到外部尺寸小于100微米的金属颗粒。因此,我们开发了基于具有高性能磁屏蔽的高T-c SQUID显微镜的检测系统。建议使用具有0.5毫米厚真空窗口的SQUID显微镜。这种设计使SQUID能够接近1 mm的距离来测量物体,并提高了灵敏度。精心设计并制造了带有套管的新型磁屏蔽。结果,我们可以成功地测量100微米大小的小颗粒。使用常规的X射线检测方法很难达到该检测水平。

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