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首页> 外文期刊>Superconductor Science & Technology >Improved grain boundary currents in textured YBa_2Cu_3O_(delta) thin films on bicrystalline Ni substrates
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Improved grain boundary currents in textured YBa_2Cu_3O_(delta) thin films on bicrystalline Ni substrates

机译:改进的双晶镍基体上织构化的YBa_2Cu_3O_(δ)薄膜中的晶界电流

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摘要

Using magneto optical imaging a comparative study of YBa_2Cu_3O_(delta) thin films grown on Gd- 10 at percent doped CeO_2 buffered Ni and SrTiO_3 bicrystals with tilt angles ranging from 3 deg to 16 deg has been made. The Ni substrates have been chosen as a model system for the RABiTS coated conductor technology. It is found that the YBa_2Cu_3O_(delta) grain boundaries on Ni exhibit improved superconducting transport properties, while for the intra-granular critical currents a moderate decrease is observed. The improved J_(gb)/J_c ratio could be detected for all studied grain boundary angles as well as over the whole accessible temperature range from 8 to 60 K. Extensive x-ray measurements on the in- and out-of-plane texture of all layers have been performed to explain the change in the intra- and inter-granular critical currents.
机译:利用磁光成像技术,对在Gd-10上生长的YBa_2Cu_3O_δ薄膜进行了比较研究,该薄膜的掺杂角度为CeO_2缓冲的Ni和SrTiO_3双晶,倾斜角度范围为3度到16度。 Ni基体已被选作RABiTS涂层导体技术的模型系统。发现Ni上的YBa_2Cu_3O_δ晶界表现出改善的超导传输性能,而对于晶内临界电流观察到适度的降低。对于所有研究的晶界角以及在8至60 K的整个可访问温度范围内,都可以检测到改善的J_(gb)/ J_c比。对​​X射线的平面内和平面外纹理进行广泛的X射线测量已经完成了所有的层以解释晶内和晶间临界电流的变化。

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