Atomic Perspectives Optimization of ED-XRF Excitation Configuration Parameters to Determine Trace-Element Concentrations in Organic and Inorganic Sample Matrices

摘要

This column installment describes a novel energy-dispersive X-ray fluorescence (ED-XRF) system that uses a combination of a Bragg polarizer, used simultaneously with a direct excitation source, together with a novel, highly annealed pyrolytic graphite (HAPG) crystal as a band-pass filter. By selection of the optimum configuration, this system allows for high analysis precision for minor and major elements across a wide wavelength range and lower detection capability for smaller groups of elements from potassium to manganese. To show the practical benefits of this technology, this study focuses on these performance metrics for the determination of titanium in polymer samples, together with the multielement analysis of high-purity graphite using the ashing sample preparation method. In particular, this installment of "Atomic Perspectives" demonstrates the improved performance for graphite that allows for lower sample weights to be used and results in significantly shorter ashing times, which is a requirement for process control applications and laboratories with a high sample workload.