Some aspects of the high-temperature behavior of bismuth,s trontium and barium on silicon surfaces studied by total reflection X-ray fluorescence spectrometry

G.Kilian; B.O.Kolbesen; M.Rommel; W.Pamler; A.Hopfner

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Some aspects of the high-temperature behavior of bismuth,s trontium and barium on silicon surfaces studied by total reflection X-ray fluorescence spectrometry

机译：全反射X射线荧光光谱法研究铋，锶和钡在硅表面高温行为的某些方面

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来源
《Spectrochimica Acta, Part B. Atomic Spectroscopy 》 |2001年第11期| 共7页
作者
G.Kilian; B.O.Kolbesen; M.Rommel; W.Pamler; A.Hopfner;
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正文语种 eng
中图分类原子光谱学 ; 分析化学 ;
关键词
ferroelectric films; metal contamination; annelaing behaviour; elymat; minority carrier lifetime;

机译：铁电薄膜;金属污染;退火行为;elymat;少数载流子寿命;

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1. Some aspects of the high-temperature behavior of bismuth,s trontium and barium on silicon surfaces studied by total reflection X-ray fluorescence spectrometry [J] . G.Kilian, B.O.Kolbesen, M.Rommel, Spectrochimica Acta, Part B. Atomic Spectroscopy . 2001 ,第11期

机译：全反射X射线荧光光谱法研究铋，锶和钡在硅表面高温行为的某些方面
2. Comparison of direct-total-reflection X-ray fluorescence, sweeping-total-reflection X-ray fluorescence and vapor phase decomposition-total-reflection X-ray fluorescence applied to the characterization of metallic contamination on semiconductor wafers [J] . Adrien Danel, Nicolas Cabuil, Thierry Lardin Spectrochimica Acta, Part B. Atomic Spectroscopy . 2008 ,第12期

机译：直接全反射X射线荧光，扫掠全反射X射线荧光和气相分解全反射X射线荧光用于表征半导体晶片上金属污染的比较
3. Three-Dimensional Structure Analyses of Cu Species Dispersed on TiO_2(110) Surfaces Studied by Polarization-Dependent Total-Reflection Fluorescence X-ray Absorption Fine Structure (PTRF-XAFS) [J] . Yasuhiro Tanizawa, Takafumi Shido, Wang-Jae Chun, The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical . 2003 ,第47期

机译：偏振相关的全反射荧光X射线吸收精细结构（PTRF-XAFS）研究了分散在TiO_2（110）表面上的Cu物种的三维结构分析
4. IMPLEMENTATION OF THE PHENOMENON OF TOTAL REFLECTION FOR TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRY TECHNIQUE SIMULATION [C] . Marcio H. dos Santos, Marcelo P. de Albuquerque, Marcelino J. dos Anjos, International Nuclear Atlantic Conference . 2018

机译：总反射X射线荧光光谱技术仿真的总反射现象的实现
5. Kinetics of insulin association with erythrocyte membrane studied by total internal reflection fluorescence with fluorescence recovery after photobleaching. [D] . Fulbright, Robert Marion, Jr. 1991

机译：通过全内反射荧光与光漂白后的荧光恢复研究了胰岛素与红细胞膜的缔合动力学。
6. The desorption of ribonuclease A from charge density gradient surfaces studied by spatially-resolved total internal reflection fluorescence [O] . Y.S. Lin, V. Hlady -1

机译：通过空间分辨全内反射荧光研究核糖核酸酶A从电荷密度梯度表面的解吸
7. Determination of Trace Impurities in Graphite and Silicon Carbide by Total Reflection X-ray Fluorescence Spectrometry after Homogeneous Liquid-Liquid Extraction. [O] . Hitoshi Yamaguchi, Shinji Itoh, Shukuro Igarashi, 2000

机译：通过全反射X射线荧光光谱法测定石墨和碳化硅中痕量杂质的含量液液萃取。

Some aspects of the high-temperature behavior of bismuth,s trontium and barium on silicon surfaces studied by total reflection X-ray fluorescence spectrometry

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