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Phase transition sequence in ferroelectric Aurivillius compounds investigated by single crystal X-ray diffraction

机译:单晶X射线衍射研究铁电奥氏体化合物的相变序列

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摘要

The investigation of the phase transition sequence in SrBi_2Ta_2O_9 (SBT) and SrBi_2Nb_2O_9 (SBN) is reported using single-crystal X-ray diffraction. By monitoring specific reflections as a function of temperature, sensitive either to the superstructure formation or to polar displacements, it was possible to check the existence or not of an intermediate phase. This latter was confirmed in SBT, but within experimental accuracy could not be detected in SBN.
机译:利用单晶X射线衍射研究了SrBi_2Ta_2O_9(SBT)和SrBi_2Nb_2O_9(SBN)中的相变序列。通过监测对上部结构形成或极移敏感的,随温度变化的特定反射,可以检查中间相的存在与否。后者已在SBT中得到确认,但在SBN中无法检测到实验精度。

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