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Characteristics of GaAs solar cells on Ge substrate with a preliminary grown thin layer of AlGaAs

机译:具有预先生长的AlGaAs薄层的Ge衬底上的GaAs太阳能电池的特性

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摘要

Characteristics of GaAs solar cell on Ge substrate with a new buffer layer structure is reported. The buffer layer structure, which consisted of a preliminarily grown thin layer of AlxGa1-xAs and a 1 mu m thick GaAs layer, was designed to obtain a high quality GaAs layer on Ge substrate by metalorganic chemical vapor deposition (MOCVD). Performance of a GaAs solar cell fabricated on Ge substrate with the buffer layer structure was compared with that fabricated on Ge substrate with a conventional GaAs buffer layer and also that fabricated on GaAs substrate. A conversion efficiency of 23.18% (AM1.5G) was successfully obtained for the cell fabricated on Ge substrate with the new buffer layer structure, while it was 20.92% for the cell fabricated on Ge substrate with the conventional GaAs buffer layer. Values of V-oc and J(sc) for the cell fabricated on Ge substrate with the new buffer layer structure were approximately comparable to those of a 25.39% efficiency GaAs solar cell fabricated on GaAs substrate. [References: 5]
机译:报道了具有新的缓冲层结构的Ge衬底上的GaAs太阳能电池的特性。设计缓冲层结构,该缓冲层结构由预先生长的AlxGa1-xAs薄层和1μm厚的GaAs层组成,旨在通过金属有机化学气相沉积(MOCVD)在Ge衬底上获得高质量的GaAs层。比较了在具有缓冲层结构的Ge衬底上制造的GaAs太阳能电池的性能与在具有常规GaAs缓冲层的Ge衬底上制造的GaAs太阳能电池以及在GaAs衬底上制造的GaAs太阳能电池的性能。对于具有新型缓冲层结构的Ge衬底上制造的电池,成功获得23.18%(AM1.5G)的转换效率,而对于具有常规GaAs缓冲层的Ge衬底上制造的电池,其转换效率为20.92%。在具有新的缓冲层结构的Ge基板上制造的电池的V-oc和J(sc)值与在GaAs基板上制造的25.39%效率的GaAs太阳能电池的V-oc和J(sc)值大致相当。 [参考:5]

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