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Comparison of electrochromic amorphous and crystalline tungsten oxide films

机译:电致变色非晶和结晶氧化钨薄膜的比较

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摘要

A detailed systematic study of the tungsten oxide thin films has been carried out using WO3 films after they were annealed at progressively increasing temperatures ranging from 350degreesC to 450degreesC in oxygen environments. The structural properties of the films were characterized using X-ray diffraction and Raman spectroscopy. The amorphous WO3 films remain as an amorphous phase up to 385degreesC and begin to crystallize at 390degreesC and then are completely crystallized at 450degreesC. Absorption peaks of the films are found to shift to a higher energy side with increasing annealing temperature up to 385degreesC and then shift abruptly to a lower energy as the films begin to crystallize at 390degreesC. Deconvolution of the absorption spectra shows that there are two different polaron transitions in the amorphous WO3 films. (C) 2003 Elsevier B.V. All rights reserved. [References: 10]
机译:在氧气环境中,在逐渐升高的温度(从350摄氏度到450摄氏度)下进行退火之后,已经使用WO3薄膜对氧化钨薄膜进行了详细的系统研究。使用X射线衍射和拉曼光谱对膜的结构性质进行表征。非晶态WO3薄膜在高达385°C时仍为非晶态,并在390°C时开始结晶,然后在450°C时完全结晶。发现随着退火温度的升高,薄膜的吸收峰移至较高能量侧,直至385摄氏度,然后随着薄膜在390摄氏度开始结晶而突然移至较低的能量。吸收光谱的反卷积表明,在非晶态WO3薄膜中存在两个不同的极化子跃迁。 (C)2003 Elsevier B.V.保留所有权利。 [参考:10]

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