Study of Uncured Sealant Contaminating Liquid Crystal in One Drop Filling Process of Thin Film Transistor Liquid Crystal Display

摘要

In this paper, the uncured sealant contaminating liquid crystal (USCLC) in one drop filling (ODF) process for thin film transistor liquid crystal display (TFT-LCD) producing was studied. Sealant idle time (from sealant dispensing to alignment) and LC idle time (from LC filling to alignment) was investigated. The uncured sealant maintained its shape, cross section and no material spreading on substrate after dispensing for even 60 minutes. LC idle time of 30 minutes would lead to serious USCLC which was observed and detected by microscope and liquid chromatograph-mass spectrometer (LC-MS). It was proposed that the expanding LC on substrate approached to edge sealant during LC idle time. The contacting time of uncured sealant and LC was increased in the following process. Thus, besides UV idle time (from UV curing to alignment,) LC idle time was of importance for USCLC. Additionally, LC penetrating deformation of uncured sealant (LC penetrating) was proved to be no direct relation to USCLC.