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首页> 外文期刊>Sensors and Actuators, A. Physical >Multi-wavelength combination source with fringe pattern transform technique to reduce the equivalent coherence length in white light interferometry
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Multi-wavelength combination source with fringe pattern transform technique to reduce the equivalent coherence length in white light interferometry

机译:具有条纹图案变换技术的多波长组合光源,可减少白光干涉仪中的等效相干长度

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摘要

Coherence length is one of the key factors to determine the measurement resolution in white light interferometry. By the use of multi-wavelength combination source, the equivalent coherence length can be greatly reduced. In this work, the multi-wavelength combination source together with the fringe pattern transform technique is used to further reduce the equivalent coherence length and achieve a stable, high precision white light interferometric measurement. (C) 2000 Elsevier Science S.A. All rights reserved. [References: 8]
机译:相干长度是确定白光干涉仪中测量分辨率的关键因素之一。通过使用多波长组合源,等效相干长度可以大大减小。在这项工作中,多波长组合源与条纹图案变换技术一起用于进一步减小等效相干长度并实现稳定,高精度的白光干涉测量。 (C)2000 Elsevier Science S.A.保留所有权利。 [参考:8]

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