Particles nanomanipulation by the enhanced evanescent field through a near-field scanning optical microscopy probe

摘要

A near-field scanning optical microscopy (NSOM) probe and a polarized semiconductor laser (808 nm, cw) were applied to push the trapping resolution down to 120 nm on near-field optical manipulation. A multi-circular shape with a minimum size of 400 nm consisting of 120 nm polystyrene particles can be obtained. They are at a resolution of d (d: NSOM probe tip diameter) and λ/7 (λ: laser wavelength), respectively. It is proved that sample concentration and laser power can affect feature size of trapping patterns. In this paper, the effect of trapping forces acted on a nanoparticle along three axis directions on trapping positions is studied, and different trapping positions are generated: the aperture edge in polarization direction and center surface of the probe tip. The result indicates that the single mode NSOM fiber probe is able to trap nanoparticles in a circular shape with lower laser intensity than that required by conventional optical tweezers. The simulated trapping positions around the probe tip based on the conservation law of momentum are found to agree well with experimental results.