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Grain growth model for electric field-assisted processing and flash sintering of materials

机译:材料电场辅助加工和快速烧结的晶粒长大模型

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摘要

This paper proposes a model to explain interesting features of grain growth retardation and saturation during electric field-assisted processing and flash sintering of materials. It is argued that electric field-induced defect generation and segregation of these defects at dislocations and grain boundaries can retard the grain growth rate and reduce it to zero as a result of grain boundary melting under flash sintering. Grain growth rates are derived taking into account kinetic and various thermodynamic factors under an applied field and compared with other models.
机译:本文提出了一个模型来解释在电场辅助处理和材料的快速烧结过程中晶粒生长延迟和饱和的有趣特征。有人认为,电场引起的缺陷的产生以及这些缺陷在位错和晶界处的偏析会阻碍晶粒的生长速度,并且由于闪速烧结下的晶界熔化而将其降低至零。考虑到应用领域中的动力学和各种热力学因素,得出谷物的生长速率,并与其他模型进行比较。

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