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首页> 外文期刊>CERAMICS INTERNATIONAL >Structural, dielectric and electrical studies in tungsten doped SrBi_2Ta_2O_9 ferroelectric ceramics
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Structural, dielectric and electrical studies in tungsten doped SrBi_2Ta_2O_9 ferroelectric ceramics

机译:掺钨SrBi_2Ta_2O_9铁电陶瓷的结构,介电和电学研究

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摘要

The effect of tungsten doping on the structural, dielectric and impedance properties of SrBi_2Ta_2O_9 (SBT) ferroelectric ceramics is reported. Tungsten doped SrBi_2(W_xTa_(1-x))_2O_9 (0.0 < = x < = 0.20) ceramics were synthesized by the solid state reaction method. X-ray diffractograms of the samples reveal the single phase layered perovskite structure formation with tungsten content x < = 0.05. Variation in the lattice parameters has been explained in terms of the limited structural constraint and relaxation imposed by the Bi-0 interlayer. Dielectric constant (e) and dielectric loss (tan S) measurements as a function of temperature reveal a decrease in the Curie temperature (T_c) from 320 deg C (for x = 0.0) to 291 deg C (for x = 0.025) and an increasing trend over the doping range of 0.05 < = x < = 0.20. Significant reduction in the dielectric loss with tungsten addition have been observed. The observed changes in e and tan 5 with frequency and temperature have been considered in the light of oxygen and cationic vacancies in tungsten doped samples. Dielectric constant of the samples increases with tungsten doping at their respective Curie temperatures. These have been viewed in terms of relative dominance of the ionic and electronic polarizations. Bulk conductivity of the samples as deduced through ac impedance investigations indicate an increased electronic conduction beyond the observed solubility limit of 0.05 of tungsten doping.
机译:报道了钨掺杂对SrBi_2Ta_2O_9(SBT)铁电陶瓷的结构,介电和阻抗特性的影响。通过固态反应法合成了掺钨的SrBi_2(W_xTa_(1-x))_ 2O_9(0.0 <= x <= 0.20)陶瓷。样品的X射线衍射图显示出钨含量x <= 0.05的单相层钙钛矿结构形成。已经根据Bi-0中间层施加的有限的结构约束和弛豫来解释晶格参数的变化。介电常数(e)和介电损耗(tan S)测量值与温度的关系揭示了居里温度(T_c)从320摄氏度(对于x = 0.0)下降到291摄氏度(对于x = 0.025)和在0.05 <= x <= 0.20的掺杂范围内增加趋势。已经观察到随着添加钨,介电损耗显着降低。考虑到钨掺杂样品中的氧和阳离子空位,考虑到了e和tan 5随频率和温度的变化。样品的介电常数在其各自的居里温度下随钨掺杂而增加。已经从离子和电子极化的相对优势来观察了这些。通过交流阻抗研究推断出的样品的体导电率表明,电子导电性增加,超过了所观察到的钨掺杂的溶解度极限0.05。

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