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Effect of substrate temperature on the structural, electrical, and optical properties of GZO/ZnO films deposited by radio frequency magnetron sputtering

机译:基板温度对射频磁控溅射沉积的GZO / ZnO薄膜的结构,电学和光学性质的影响

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摘要

Ga-doped ZnO (GZO)/ZnO bi-layered films were deposited on glass substrates by radio frequency magnetron sputtering at different substrate temperatures of 100, 200 and 300 °C to investigate the effects of substrate temperature on the structural, electrical, and optical properties of the films. Thicknesses of the GZO and ZnO buffer layer were kept constant at 85 and 15 nm by controlling the deposition times.The films deposited at room temperature had a relatively low optical transmittance of 80.5%, while films deposited at substrate temperature of 300 °C showed a higher transmittance of 84.5% compared to the other films. Electrical resistivity of the films was also influenced by substrate temperature and the lowest resistivity of 2.7 × 10~(-3) Ω. cm was observed for films deposited at 300 °C. The observed result means that increasing the substrate temperature enhanced the optical transmittance and electrical conductivity of GZO/ZnO bi-layered films, simultaneously.
机译:在100、200和300°C的不同基板温度下,通过射频磁控溅射在玻璃基板上沉积Ga掺杂的ZnO(GZO)/ ZnO双层薄膜,以研究基板温度对结构,电学和光学的影响。膜的性质。通过控制沉积时间,GZO和ZnO缓冲层的厚度保持恒定在85和15 nm。在室温下沉积的薄膜的透光率相对较低,为80.5%,而在基板温度为300°C的薄膜显示出与其他薄膜相比,透射率更高,达到84.5%。薄膜的电阻率还受基板温度和最低电阻率2.7×10〜(-3)Ω的影响。对于在300℃下沉积的膜观察到10cm。观察到的结果意味着,提高基板温度同时提高了GZO / ZnO双层膜的透光率和导电率。

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