The transformation of intensity fluctuations accompanying the nonlinear resonance reflection of light from a glass-resonant gas interface is discussed. The illumination of the interface at angles close to the critical angle for total internal reflection is found to have certain advantages over orthogonal incidence. At the maximum of the strongest resonance, the reflected light intensity amounts to more than 50% of the incident light. In these conditions, a squeezing of the amplitude (photon) fluctuations is observed in the radiation generated by a semiconductor laser-nonlinear selective reflector system. A simple semiclassical theory adequately describes some important characteristics of this system: the shape of the reflection resonances, the strength of the saturation fields, and so on.
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