2D FOCUSING WITH AN OFF-AXIS ELLIPTICAL BRAGG-FRESNEL MULTILAYER LENS AND APPLICATION TO X-RAY IMAGING

摘要

We demonstrate the design, the fabrication and use of an off-axis elliptical Bragg-Fresnel multilayer lens to produce a focal spot of zero-order background. We describe here the principle of these new focusing optics and its first utilization on the X-ray synchrotron beam at LURE (Orsay, France). Imaging tests of a binary object at 1750 eV using the third-order diffraction of the lens are also presented. [References: 32]