Electro-optic property measurements of electrostatically self-assembled ultrathin films

摘要

A new class of ultrathin electro-optic films have been developed by the electrostatically self-assembled monolayer process. Using a simple ellipsometric technique, the electro-optic coefficients were measured as a function of the frequency of the applied electric field. The maximum of the coefficients is 600 pm/V. From these measurements, we deduce the orientational and the electronic contributions to the electro-optic modulation. At modulating frequencies lower than 20 Hz, the orientation dominates the electro-optic modulation process. At frequencies higher than 800 Hz, electrons are responsible for electro-optic behavior.