Experimental and theoretical evidence of pump-saturation effects in low power end-pumped Nd:YVO_(4) microchip laser

摘要

Pump-saturation effects have been measured in a miniaturized end-pumped solid-state Nd:YVO_(4) laser. In particular we have investigated the influence of the pump beam width on the laser characteristics (threshold pump power and laser efficiency). A numerical rate-equation model has been developed in order to explain these results and lead to a good quantitative agreement with the experimental data.