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Modification of microstructure of the surface and the bulk in ion-irradiated membrane studied using positron annihilation spectroscopy

机译:用正电子an没光谱研究离子辐照膜表面和整体的微观结构

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The effect of ion irradiation and etching on the microstructure of polyethyleneterephthalate (PET) membrane has been studied using positron annihilation spectroscopy. PET membrane of 25 μm thickness was irradiated by 100 MeV ~(35)Cl beam (7 x 10~7 ions/cm~2) and then etched with NaOH for 45 min. The modification in the microstructure at the surface of the membrane was probed by depth-dependent Doppler-broadened S-parameter and positronium 3γ-2γ annihilation ratio using a slow positron beam, while the free volume properties in the bulk of the membrane were studied using the conventional positron lifetime technique. Positron annihilation parameters were found to be very sensitive to the microstructural changes occurring in the polymer at such a low fluence. It was observed that on ion-irradiation, the surface of the membrane is modified in a different way than the bulk. While the ion-irradiation produces large fraction of excess free volumes at the surface of the membrane due to chain scission, the free volumes are reduced in the bulk of the membrane due to cross-linking. FTIR and XRD measurements were also carried out to investigate the changes occurring in the chemical structure and crystallinity of the polymer samples on ion-irradiation and etching.
机译:使用正电子ni没光谱技术研究了离子辐照和蚀刻对聚对苯二甲酸乙二酯(PET)膜微结构的影响。用100 MeV〜(35)Cl光束(7 x 10〜7离子/ cm〜2)辐照25μm厚的PET膜,然后用NaOH蚀刻45分钟。用慢速正电子束通过深度依赖的多普勒展宽的S参数和正电子3γ-2γan没比探测了膜表面的微观结构的改变,并用负电荷研究了膜主体中的自由体积性质。传统的正电子寿命技术。发现正电子an没参数对在如此低通量下聚合物中发生的微结构变化非常敏感。已经观察到,在离子辐照下,膜的表面以与本体不同的方式改性。尽管由于断链,离子辐照在膜表面产生了很大一部分多余的自由体积,但由于交联,膜的大部分自由体积减少了。还进行了FTIR和XRD测量,以研究离子辐照和蚀刻后聚合物样品化学结构和结晶度的变化。

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