Quantum information processing and metrology with trapped ions

摘要

The use of trapped atomic ions in the field of quantum information processing is briefly reviewed. We summarize the basic mechanisms required for logic gates and the use of the gates in demonstrating simple algorithms. We discuss the potential of trapped ions to reach fault-tolerant error levels in a large-scale system, and highlight some of the problems that will be faced in achieving this goal. Possible near-term applications in applied and basic science, such as in metrology and quantum simulation, are briefly discussed.