CENAM REPORT

摘要

Since 1995, CENAM has organized six symposiums of metrology that have been the forum for national and international specialists to share their experiences and knowledge in this field. This year will not be the exception, as the Symposium of Metrology 2006 will bring together distinguished participants who will talk about their achievements and challenges. All attendees will have the opportunity to participate in sessions with colleagues who are involved in the daily work of measuring and calibrating, and who will show their methods and new techniques for the solution of measurement problems.