CONFERENCE REPORT

摘要

The 2006 conference was held at the Nashville Convention Center. Total attendance was 1081, with 480 attending tutorials before and after the conference. Our Keynote speaker was Jim Sylvester, recently retired from heading up Verizon's Quality Control Division. Jim illustrated how important the relationship between metrology, testing and measurement was to the manufacturing of acceptable product. He also talked about the consequences in dollars when measurement and quality-are not adequate. The announcement of the Wildhack Award followed the keynote address, and everyone approved of the change to the program from previous years. Our winner of the 2006 Wildhack Award is John Wehrmeyer, retired from Kodak and currently an assessor for A2LA.