A study of the topographic and electrical properties of self-assembled islands of alkylsilanes on mica using a combination of non-contact force microscopy techniques

摘要

We use a combination of non-contact scanning force microscope operation modes to study the changes in topographic and electrostatic properties of self-assembled monolayer islands of alkylsilanes on mica. The combined technique uses simultaneous electrical and mechanical modulation and feedback modes to produce four images that reveal the topography, phase, surface potential and dielectric constant. The results show significant advantages with this combined method. As an example we show that the interaction of water with self-assembled monolayer islands of alkylsilanes produces changes in the surface potential of the system but not in the topography.