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Determination of the Riemann modulus and sheet resistivity by a six-point generalization of the van der Pauw method

机译:通过范德堡方法的六点推广确定黎曼模量和薄层电阻率

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摘要

A six-point generalization of the van der Pauw method is presented. The method is applicable for 2D homogeneous systems with an isolated hole. A single measurement performed on the contacts located arbitrarily on the sample edge allows us to determine the specific resistivity and a dimensionless parameter related to the hole, known as the Riemann modulus. The parameter is invariant under conformal mappings of the sample shape. The hole can be regarded as a high resistivity defect. Therefore, the method can be applied for the experimental determination of the sample inhomogeneity.
机译:提出了范德堡方法的六点推广。该方法适用于带有隔离孔的2D均匀系统。对任意位于样品边缘的接触点进行的单次测量使我们能够确定比电阻率和与孔有关的无量纲参数,称为黎曼模量。该参数在样本形状的保形映射下是不变的。该孔可被认为是高电阻率缺陷。因此,该方法可用于样品不均匀性的实验测定。

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