Agglomeration of point defects in ferroelectric ceramics under cyclic electric field

摘要

This paper Studies the agglomeration of point defects in ferroelectric ceramics driven by repeated domain switching under cyclic electric field. A finite element method that incorporates mass transfer capacity is formulated to simulate the movement of point defects subjected to the kinetics of pore surface diffusion and domain wall migration. The simulation of pore agglomeration qualitatively agrees with the experimental data, namely the point defects migrate from the edges to the centre of the sample under cyclic electric field.