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Topology of grain microstructures in two dimensions: a comparison of grain boundary and triple junction controlled grain growth

机译:二维晶粒微观结构的拓扑:晶界和三结控制晶粒生长的比较

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摘要

The topology of polycrystalline grain microstructures is compared for the cases of normal, boundary controlled grain growth and triple junction controlled grain growth as it may occur in nanocrystalline materials. To this end, Monte Carlo Potts model simulations have been performed in two dimensions. Independent of the microstructural feature (respectively, its mobility controlling the evolution) growth regimes with topological self-similarity can be observed. In particular, it is found that each growth regime is characterized by its own distinct topology, enabling a deduction of the associated growth kinetics. The results are in very good agreement with theoretical predictions and computer simulations found in the literature.
机译:比较了正常,边界控制的晶粒生长和三结控制的晶粒生长的情况下多晶晶粒微观结构的拓扑,因为它可能发生在纳米晶体材料中。为此,已经在二维上进行了蒙特卡洛波特模型仿真。可以观察到具有微观结构自相似性的独立于微观结构特征(分别由其移动性控制演化)的生长机制。特别地,发现每种生长方案都以其自身独特的拓扑结构为特征,从而能够推导相关的生长动力学。结果与文献中的理论预测和计算机模拟非常吻合。

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