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Observation of Cu_2ZnSnS_4 thin film prepared by RF magnetron sputtering for heterojunction applications

机译:射频磁控溅射制备异质结应用Cu_2ZnSnS_4薄膜的观察

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摘要

In this paper, copper-zinc-tin-sulfide (Cu_2ZnSnS_4) thin film was successfully fabricated by radio-frequency (RF) magnetron sputtering on glass substrate. The structural, optical and electrical properties of the film were studied by X-ray photoelectron spectroscopy (XPS), laser micro-Raman spectrometer, field emission scanning electron microscope (FESEM), UV-VIS spectrophotometer and Hall effect measurement, respectively. The results show that Cu_2ZnSnS_4 film is of good quality. A good nonlinear rectifying behavior is obtained for the GZO/Cu_2ZnSnS_4 heterojunction. Under reverse bias, high photocurrent is obtained.
机译:本文通过射频(RF)磁控溅射在玻璃基板上成功制备了硫化铜-锌-锡-锡(Cu_2ZnSnS_4)薄膜。分别通过X射线光电子能谱(XPS),激光显微拉曼光谱仪,场发射扫描电子显微镜(FESEM),UV-VIS分光光度计和霍尔效应测量来研究膜的结构,光学和电学性质。结果表明,Cu_2ZnSnS_4薄膜质量良好。 GZO / Cu_2ZnSnS_4异质结具有良好的非线性整流性能。在反向偏置下,可获得高光电流。

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