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On the significance of small deviations from higher symmetry

机译:关于高对称性小偏差的意义

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Small deviations from higher symmetry can be established by single crystal diffraction methods by (1) measuring the metric of the unit cell with high non routine precision (2) measuring a full reflection sphere of diffraction data and testing it for the presence or absence of symmetry elements in the dataset (3) refining the structure in both the higher and the lower symmetry and comparing the results (4) checking the refined crystal or the presence or absence of hidden symmetry elements. By these criteria it is not established that the v{120} growth sector of yugawaralite really has triclinic symmetry (Tanaka et al., 2002). On the contrary the refined metrical parameters and the atomic positions conform to monoclinic symmetry within the margins of experimental error.
机译:可以通过单晶衍射方法建立较高的对称性的较小偏差,方法是:(1)以非常规的高精度测量晶胞的度量值(2)测量衍射数据的全反射球并测试其是否存在对称性数据集中的元素(3)分别以较高和较低的对称性精炼结构,并比较结果(4)检查精炼的晶体或是否存在隐藏的对称性元素。根据这些标准,尚不能确定汤河拉力石的v {120}生长区确实具有三斜对称性(Tanaka等,2002)。相反,精制的度量参数和原子位置在实验误差范围内符合单斜晶对称性。

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