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首页> 外文期刊>Minerals Engineering >Pyrochlore surface oxidation in relation to matrix Fe composition: A study by X-ray photoelectron spectroscopy
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Pyrochlore surface oxidation in relation to matrix Fe composition: A study by X-ray photoelectron spectroscopy

机译:烧绿石表面氧化与基体铁成分的关系:X射线光电子能谱研究

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摘要

The flotation recovery of pyrochlore from the Saint-Honore Carbonatite ore has been related to the variability in the mineral matrix Fe content; high Fe pyrochlore grains consistently report to the tails. Previous research has tentatively suggested that surface oxidation of high Fe pyrochlore grains may be driving partitioning of the pyrochlore grains to the tails. X-ray photoelectron spectroscopy (XPS) was used to examine the relationship between matrix Fe content and surface oxidation in high Fe pyrochlore grains and high Fe zoned regions in pyrochlore grains from the Carbonatite ore. XPS analyses of pyrochlore grains showed that a greater proportion of surface oxidation species corresponded to the zones with high matrix Fe content. The XPS data along with previously presented Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) data demonstrates a relationship between matrix Fe content and collector attachment. The Fe rich pyrochlore grains or zones show a higher degree of oxidation relative to the Fe poor grains or zones. The data reveal that collector attachment favors low Fe grains or zones, likely in response to a lower degree of surface oxidation.
机译:从Saint-Honore碳酸盐矿石中浮选烧绿石的回收与矿物基质中Fe含量的变化有关。高铁烧绿石晶粒始终向尾巴报告。先前的研究初步表明,高铁烧绿石晶粒的表面氧化可能会促使烧绿石晶粒向尾部分配。 X射线光电子能谱(XPS)用于检查基碳石矿石中高铁烧绿石晶粒和烧绿石晶粒中高铁分区区域的基体铁含量与表面氧化之间的关系。烧绿石晶粒的XPS分析表明,较大比例的表面氧化物质对应于基体铁含量高的区域。 XPS数据与先前提供的飞行时间二次离子质谱(TOF-SIMS)数据一起证明了基体Fe含量与收集器附着之间的关系。富铁的烧绿石晶粒或区域相对于贫铁的晶粒或区域显示更高的氧化程度。数据表明,集电器的附着有利于低铁含量的晶粒或区域,这可能是由于较低的表面氧化程度所致。

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