Correlative RISE microscopy: Raman imaging meets scanning electron probe microscopy

摘要

RISE microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and Scanning Electron Microscopy to link molecular compound information with structural surface properties. Raman and SEM are integrated within the same instrument, obviating the need to transfer the sample from one device to another. The streamlined selection of techniques ensures flawless retrieval of the sample's area of analysis. Featuring five examples from various scientific fields, we illustrate the microscope's range of application. With RISE we have identified minerals in geological specimens, imaged allotropes and polymorphs and visualized non-conducting, organic structures. The new combination enables unprecedented capability in comprehensive sample characterization.