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首页> 外文期刊>Microwave and optical technology letters >HIGH-POWER EMISSION, NARROW-BEAM SCANNING, AND SUB-WAVELENGTH IMAGING USING CONDUCTING GRATINGS AND LEFT-HANDED MATERIALS
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HIGH-POWER EMISSION, NARROW-BEAM SCANNING, AND SUB-WAVELENGTH IMAGING USING CONDUCTING GRATINGS AND LEFT-HANDED MATERIALS

机译:使用导电光栅和左手持材进行高功率发射,窄光束扫描和亚波长成像

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摘要

Many amazing properties of a novel electromagnetic (EM) structure, consisting a conducting grating backed with a left-handed material (LHM) slab, are studied, High-directivity, high-power emission and narrow-beam scanning can be easily realized when this structure acts as an antenna. Simultaneously, if it works as an imaging system, extremely high resolution can also be obtained with the unique EM behaviors of the LHM, Proper usage of surface waves on apertures opened in the conducting screen makes this structure possess such attractive capabilities, In order to investigate such phenomena, a more general EM model is first developed through the equivalence principle, and then the method of moments is implemented to obtain the interesting results. All these amazing properties are clearly observed through the numerical results.
机译:研究了新型电磁(EM)结构的许多惊人特性,该结构由带有左手材料(LHM)板支持的导电光栅组成,当这种情况下,可以轻松实现高方向性,高功率发射和窄束扫描结构充当天线。同时,如果将其用作成像系统,则还可以通过LHM的独特EM行为获得极高的分辨率。在导电屏上开口的孔上正确使用表面波使该结构具有如此诱人的功能,对于这种现象,首先通过等价原理建立了更通用的EM模型,然后采用矩量法获得了有趣的结果。通过数值结果可以清楚地观察到所有这些惊人的特性。

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