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Advantages of a monochromator for bandgap measurements using electron energy-loss spectroscopy

机译:单色仪使用电子能量损失谱仪进行带隙测量的优势

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摘要

The practical advantages of a monochromator for electron energy-loss spectroscopy (EELS) in transmission electron microscopy are reviewed. The zero-loss peaks (ZLPs) of a monochromator and a cold field emission gun are compared in terms of bandgap measurement performance. The intensity of the ZLP tails at the bandgap energy is more important than the full-width at half maximum of the ZLP, and a monochromator is preferable to conventional electron sources. The silicon bandgap of 1.1 eV is evaluated from the onset in the EEL spectrum obtained using the monochromator without a numerical procedure. We also show a high-speed instability-correction technique to realize the inherent energy resolution of the monochromator, in which instabilities of less than 33.5 Hz are corrected using 512 EEL spectra obtained with an exposure time of 1.4 ms. It will be useful in bandgap measurements and advanced studies for elucidating sub-eV EEL spectra.
机译:概述了用于透射电子显微镜的电子能量损失谱仪(EELS)的单色仪的实际优势。根据带隙测量性能比较了单色仪和冷场发射枪的零损耗峰(ZLP)。带隙能量处的ZLP尾部的强度比ZLP的半峰全宽更为重要,并且单色仪优于常规电子源。从使用单色仪获得的EEL谱图中的开始评估硅带隙为1.1 eV,而无需进行数值计算。我们还展示了一种高速不稳定性校正技术,可实现单色仪的固有能量分辨率,其中使用曝光时间为1.4 ms的512个EEL光谱校正了小于33.5 Hz的不稳定性。这将对带隙测量和高级研究中阐明亚eV EEL谱图很有用。

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