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首页> 外文期刊>Micron: The international research and review journal for microscopy >Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics
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Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics

机译:使用法向入射多层光学器件对厚的碳基材料进行软X射线成像

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The high transparency of carbon-containing materials in the spectral region of "carbon window" (λ ~ 4.5-5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5 nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd-glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets.
机译:含碳材料在“碳窗”(λ〜4.5-5 nm)光谱区的高透明度为各种软X射线显微镜应用提供了新的机会。在约4.5 nm的波长下工作的高效多层镀膜X射线光学器件的发展刺激了我们的一系列成像实验,以研究较厚的生物和合成物体。我们的实验装置包括由Nd玻璃激光器的二次谐波产生的激光等离子体X射线源,scan基薄膜滤光片,Co / C多层镜和X射线胶片UF-4。所有的软X射线图像都是在一次纳秒曝光下产生的,并显示出适当的吸收对比度和受探测器限制的空间分辨率。特别注意要用于激光聚变靶设计的厚低密度泡沫材料的3D成像。

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