Prospects for improving the accuracy of silicon photodiode self-calibration with custom cryogenic photodiodes

摘要

This paper considers the possibility of improving the accuracy of the predictable quantum efficiency method (self-calibration) by using custom photodiodes at cryogenic temperatures. The photodiode quantum deficiency is partitioned into nine terms associated with different phenomenological loss mechanisms. The size of each term is estimated for operation of the photodiode at 72 K and 16 V reverse bias. Requirements for high-accuracy self-calibration of the value and uncertainty of each of the quantum deficiency terms are discussed.