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首页> 外文期刊>IEEE Transactions on Magnetics >Moment reversal characterization of thin magnetic film by VSM or AGFM
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Moment reversal characterization of thin magnetic film by VSM or AGFM

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摘要

An approach has been developed to determine the thermal stability factor (K{sub}uV{sup}*/k{sub}BT), switching volume (V{sup}*), anisotropy (K{sub}u), and dynamic coercivity (H{sub}c) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt : C and CoCrPt : SiO{sub}2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data.

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