EBSD characterization of 8090 Al-Li alloy during dynamic and static recrystallization

摘要

The microstructures of high-temperature deformed and annealed 8090 Al-Li alloy have been characterized using electron back-scattered diffraction (EBSD). The observed structure refinement, which is attributed to the dynamic and static recrystallization (DRX and SRX, respectively) for the deformation and annealing processes, respectively, was accompanied by a shift in misorientation angle distribution from low- to high-angle side, with more significant effect in the strain-induced case (DRX).